# New ellipsometric approach for determining small light ellipticities

## TL;DR

This paper introduces a highly precise ellipsometric technique for measuring small light ellipticities, utilizing phase delay compensators and accounting for multiple reflections to achieve minimal measurement error.

## Contribution

The paper presents a novel ellipsometric method that enhances accuracy in small ellipticity measurements by optimizing phase delays and considering interference effects.

## Key findings

- Measurement error does not exceed 0.02 in the specified ellipticity range.
- The method effectively accounts for multiple reflections in coherent light.
- Enhanced precision over existing ellipsometric techniques.

## Abstract

We propose a precise ellipsometric method for the investigation of coherent light with a small ellipticity. The main feature of this method is the use of compensators with phase delays providing the maximum accuracy of measurements for the selected range of ellipticities and taking into account the interference of multiple reflections of coherent light. The relative error of the ellipticity measurement in the range of mesurement does not exceed 0.02.