Alignment Methods and Analysis of Tilt Angle Range for the Data Scanned in Electron Tomography
Dongwook Kim, Kyungtaek Jun

TL;DR
This paper investigates alignment techniques for electron tomography projection data, focusing on tilt angle range and sinogram pattern analysis to improve reconstruction quality.
Contribution
It introduces methods to distinguish ideal sinogram patterns by removing translation and tilt errors, and provides guidelines for better reconstruction based on sample properties.
Findings
Effective identification of ideal sinogram patterns
Guidelines for optimal tilt angle range selection
Analysis of sample properties for reconstruction quality
Abstract
Electron tomography has been studied in various fields. Various methods have been developed to align projection sets to construct ideally focused reconstruction. In this paper, we present how to align the projection set to distinguish whether it has an ideal sinogram pattern or not by removing translation errors and vertical tilt errors. We also analyze some important properties for certain types of samples to identify whether the reconstruction image can be made through an ideal sinogram pattern. We provide a guideline for how to construct a better reconstruction image by scanning the sample through these properties.
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques
