Structured Light Phase Measuring Profilometry Pattern Design for Binary Spatial Light Modulators

TL;DR

This paper presents a novel contone-to-binary conversion algorithm for structured light phase measuring profilometry, enabling high-speed 3D scanning with reduced pattern noise on binary spatial light modulators.

Contribution

It introduces a new algorithm for converting contone patterns to binary, improving pattern fidelity and noise reduction in structured light 3D scanning.

Findings

Over 3 times reduction in pattern noise compared to traditional halftoning.

Effective binary pattern generation for high-speed structured light scanning.

Enhanced pattern fidelity with binary spatial light modulators.

Abstract

Structured light illumination is an active 3-D scanning technique based on projecting/capturing a set of striped patterns and measuring the warping of the patterns as they reflect off a target object's surface. In the case of phase measuring profilometry (PMP), the projected patterns are composed of a rolling sinusoidal wave, but as a set of time-multiplexed patterns, PMP requires the target surface to remain motionless or for scanning to be performed at such high rates that any movement is small. But high speed scanning places a significant burden on the projector electronics to produce contone patterns inside of short exposure intervals. Binary patterns are, therefore, of great value, but converting contone patterns into binary comes with significant risk. As such, this paper introduces a contone-to-binary conversion algorithm for deriving binary patterns that best mimic their contone counterparts. Experimental results will show a greater than 3 times reduction in pattern noise over traditional halftoning procedures.