# Orientational Mapping Augmented Sub-Wavelength Hyper-Spectral Imaging of Silk

## TL;DR

This study introduces a high-resolution hyper-spectral IR imaging technique to map molecular orientation within silk fibers, revealing detailed internal structure and composition at micrometer scales.

## Contribution

It presents a novel method combining polarisation-dependent IR absorbance with synchrotron radiation for direct, high-resolution orientation mapping of silk's molecular structure.

## Key findings

- Achieved spatial resolution of 1.9 to 4.2 micrometers in IR imaging.
- Mapped molecular orientation of silk's amide bands with high sensitivity.
- Provided insights into silk's amorphous and crystalline composition relationship.

## Abstract

Molecular alignment underpins optical, mechanical, and thermal properties of materials, however, its direct measurement from volumes with micrometer dimensions is not accessible, especially, for structurally complex bio-materials. How the molecular alignment is linked to extraordinary properties of silk and its amorphous-crystalline composition has to be accessed by a direct measurement from a single silk fiber. Here, we show orientation mapping of the internal silk fiber structure via polarisation-dependent IR absorbance at high spatial resolution of 4.2 micrometers and 1.9 micrometers in a hyper-spectral IR imaging by attenuated total reflection using synchrotron radiation in the spectral fingerprint region around 6 micrometers wavelength. Free-standing longitudinal micro-slices of silk fibers, thinner than the fiber cross section, were prepared by microtome for the four polarisation method to directly measure the orientational sensitivity of absorbance in the molecular fingerprint spectral window of the amide bands of b-sheets and amorphous polypeptides of silk. Flat lateral micro-slices of silk eliminates shape related artefact in determination of absorbance anisotropy and order parameters of the amide bands.