Deep Learning is Robust to Massive Label Noise
David Rolnick, Andreas Veit, Serge Belongie, Nir Shavit

TL;DR
Deep neural networks can effectively learn from large datasets with massive label noise, maintaining high test accuracy despite extensive incorrect labels, which challenges traditional views on data quality requirements.
Contribution
This paper demonstrates that deep learning models can generalize well even with heavily noisy labels and analyzes how noise impacts training dynamics and dataset size requirements.
Findings
High test accuracy (>90%) on MNIST with 100x label noise
Robustness across different noise patterns, including biased errors
Increased dataset size mitigates effects of label corruption
Abstract
Deep neural networks trained on large supervised datasets have led to impressive results in image classification and other tasks. However, well-annotated datasets can be time-consuming and expensive to collect, lending increased interest to larger but noisy datasets that are more easily obtained. In this paper, we show that deep neural networks are capable of generalizing from training data for which true labels are massively outnumbered by incorrect labels. We demonstrate remarkably high test performance after training on corrupted data from MNIST, CIFAR, and ImageNet. For example, on MNIST we obtain test accuracy above 90 percent even after each clean training example has been diluted with 100 randomly-labeled examples. Such behavior holds across multiple patterns of label noise, even when erroneous labels are biased towards confusing classes. We show that training in this regime…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMachine Learning and Data Classification · Infrastructure Maintenance and Monitoring · Industrial Vision Systems and Defect Detection
