# Calibration of a two-phase xenon time projection chamber with a $^{37}$Ar source

## TL;DR

This paper presents a calibration of a two-phase xenon detector using a $^{37}$Ar source, mapping light and charge yields at low energies and analyzing recombination effects across different electric fields.

## Contribution

It introduces a direct calibration method with $^{37}$Ar and details the dependence of yields and recombination on electric drift fields in a xenon detector.

## Key findings

- Achieved calibration at 0.27 keV (charge) and 2.8 keV (light and charge)
- Mapped light and charge yields as a function of electric field
- Determined the Thomas-Imel box parameter and energy resolution at various fields

## Abstract

We calibrate a two-phase xenon detector at 0.27 keV in the charge channel and at 2.8 keV in both the light and charge channels using a $^{37}$Ar source that is directly released into the detector. We map the light and charge yields as a function of electric drift field. For the 2.8 keV peak, we calculate the Thomas-Imel box parameter for recombination and determine its dependence on drift field. For the same peak, we achieve an energy resolution, $E_{\sigma}/E_{mean}$, between 9.8% and 10.8% for 0.1 kV/cm to 2 kV/cm electric drift fields.