# Atomic Force Nanoscope

## TL;DR

This paper introduces an Atomic Force Nanoscope that uses nanotube resonators and electron beam detection to achieve ultra-sensitive, high-resolution surface imaging and mechanical property measurement at the nanoscale.

## Contribution

It presents a novel AFM technique combining nanotube resonators with electron beam detection for real-time nanoscale surface imaging and mechanical analysis.

## Key findings

- Nanotube resonators enable ultra-sensitive force detection.
- Electron beam detection allows real-time mechanical property measurement.
- The method achieves high-resolution surface topography imaging.

## Abstract

Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced the introduction of a new class of resonators with dimensions well below the micrometer scale. In this context, nanotube resonators are the ultimate mechanical oscillators because of their one dimensional nature, small mass and almost perfect crystallinity, coupled to the possibility of functionalisation, these properties make them the perfect candidates as ultra sensitive, on-demand force sensors. However their tiny dimensions make the measurement of the mechanical properties a very challenging task in particular when working in cavity free geometry at ambient temperature. By using a highly focused electron beam, we show that the mechanical response of nanotubes can be quantitatively measured while approaching to a surface sample. By coupling electron beam detection of individual nanotubes with a custom AFM we can image the surface topography of a sample by measuring in real time the mechanical properties of the nanoresonators. The combination of very small size and mass together with the high resolution of the electron beam detection method offers unprecedented opportunities for the development of a new class of Atomic Force Nanoscope (AFN).