Advances in Atomic Resolution In Situ Environmental Transmission Electron Microscopy and 1 Angstrom Aberration Corrected In Situ Electron Microscopy

TL;DR

This paper discusses recent advances in atomic resolution in situ environmental transmission electron microscopy, enabling direct observation of gas-solid reactions at high temperatures with Angstrom-level resolution using aberration correction.

Contribution

It introduces new high-temperature in situ microscopy techniques with Angstrom resolution, expanding capabilities for dynamic material studies.

Findings

Achieved 0.11 nm resolution at 500°C in a double aberration corrected TEM/STEM.

Demonstrated real-time in situ studies of Pt and Pd nanoparticles on carbon.

Enabled dynamic observation of gas-solid reactions at atomic resolution.

Abstract

Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas-solid reactions, including at very high temperatures are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using a hot stage in an aberration corrected environment are presented. In situ data from Pt and Pd nanoparticles on carbon with the corresponding FFT (optical diffractogram) illustrate an achieved resolution of 0.11 nm at 500 C and higher in a double aberration corrected TEM and STEM instrument employing a wider gap objective pole piece. The new results open up opportunities for dynamic studies of materials in an aberration corrected environment.