Interface Phonon Modes in the [AlN/GaN]20 and [Al0.35Ga0.65N/Al0.55Ga0.45N]20 2D Multi Quantum Well Structures
A. K. Sivadasan, Chirantan Singha, A. Bhattacharyya, and Sandip Dhara

TL;DR
This paper investigates interface phonon modes in specific AlN/GaN and AlGaN/GaN multi quantum well structures, analyzing how dielectric constant variations affect these modes using plasma-assisted molecular beam epitaxy.
Contribution
It provides new insights into the interface phonon modes in these MQW structures and how dielectric properties influence their optical phonon behavior.
Findings
Interface phonon modes characterized in AlN/GaN and AlGaN/GaN MQWs
Dielectric constant variations impact phonon mode frequencies
Enhanced understanding of phonon behavior in MQW structures
Abstract
Interface phonon (IF) modes of c-plane oriented [AlN/GaN]20 and Al0.35Ga0.65N/Al0.55Ga0.45N]20 multi quantum well (MQW) structures grown via plasma assisted molecular beam epitaxy are reported. The effect of variation in dielectric constant of barrier layers to the IF optical phonon modes of well layers periodically arranged in the MQWs investigated.
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