# Electric field sensing with a scanning fiber-coupled quantum dot

## TL;DR

This paper introduces a novel scanning electric field sensor using a fiber-coupled quantum dot probe, demonstrating its ability to map electric fields with high resolution and sensitivity, validated by experiments and simulations.

## Contribution

The work presents the first application of a fiber-coupled quantum dot as a scanning electric field sensor, analyzing the influence of tip geometry on performance.

## Key findings

- Quantum-dot-in-a-tip effectively maps electric fields.
- Sensor results agree with finite element simulations.
- Tip geometry significantly affects resolution and sensitivity.

## Abstract

We demonstrate the application of a fiber-coupled quantum-dot-in-a-tip as a probe for scanning electric field microscopy. We map the out-of-plane component of the electric field induced by a pair of electrodes by measurement of the quantum-confined Stark effect induced on a quantum dot spectral line. Our results are in agreement with finite element simulations of the experiment. Furthermore, we present results from analytic calculations and simulations which are relevant to any electric field sensor embedded in a dielectric tip. In particular, we highlight the impact of the tip geometry on both the resolution and sensitivity.