Electron Mobility in Polarization-doped Al$\mathrm{_{0-0.2}}$GaN with a Low Concentration Near 10$\mathrm{^{17}}$ cm$\mathrm{^{-3}}$
Mingda Zhu, Meng Qi, Kazuki Nomoto, Zongyang Hu, Bo Song, Ming Pan,, Xiang Gao, Debdeep Jena, Huili Grace Xing

TL;DR
This study demonstrates high electron mobility in polarization-doped AlGaN with extremely low carrier concentration, highlighting the effects of dislocation and alloy scattering, and providing insights for power electronics design.
Contribution
It reports the highest mobility in low-doped polarization-induced AlGaN and analyzes scattering mechanisms affecting electron transport at low doping levels.
Findings
Peak mobility of 900 cm²/V·s at 7% Al composition
Dislocation and alloy scattering limit mobility at low doping
Dislocation density below 10^7 cm⁻² is crucial for high mobility
Abstract
In this letter, carrier transport in graded AlGaN with a polarization-induced n-type doping as low as ~ 10 cm is reported. The graded AlGaN is grown by metal organic chemical vapor deposition on a sapphire substrate and a uniform n-type doping without any intentional doping is realized by linearly varying the Al composition from 0% to 20% over a thickness of 600 nm. A compensating center concentration of ~10 cm was also estimated. A peak mobility of 900 cm/Vs at room temperature is extracted at an Al composition of ~ 7%, which represents the highest mobility achieved in n-AlGaN with a carrier concentration ~10 cm. Comparison between experimental data and theoretical models shows that, at…
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