Tuning the Electronic Properties of LAO/STO Interfaces by Irradiating LAO Surface with Low-Energy Cluster Ion Beams
Karl Ridier, Damien Aureau, Bruno B\'erini, Yves Dumont, Niels Keller,, Jackie Vigneron, Arnaud Etcheberry, Arnaud Fouchet

TL;DR
This study demonstrates that low-energy cluster ion beam irradiation of LAO surfaces can modify the chemical and electronic properties of LAO/STO interfaces, increasing conductivity through oxygen vacancy formation and surface state creation.
Contribution
It introduces a novel surface engineering method using low-energy cluster ion beams to tune LAO/STO interface properties, revealing the connection between surface chemistry and electronic behavior.
Findings
Irradiation induces oxygen vacancies and surface states.
Electrical conductivity at the interface increases.
Surface modifications affect the entire heterostructure.
Abstract
We have investigated the effects of low-energy ion beam irradiations using argon clusters on the chemical and electronic properties of LaAlO3/SrTiO3 (LAO/STO) heterointerfaces by combining X-ray photoelectron spectroscopy (XPS) and electrical transport measurements. Due to its unique features, we show that a short-time cluster ion irradiation of the LAO surface induces indirect modifications in the chemical properties of the buried STO substrate, with (1) a lowering of Ti atoms oxidation states (from Ti4+ to Ti3+ and Ti2+) correlated to the formation of oxygen vacancies at the LAO surface and (2) the creation of new surface states for Sr atoms. Contrary to what is observed by using higher energy ion beam techniques, this leads to an increase of the electrical conductivity at the LAO/STO interface. Our XPS data clearly reveal the existence of dynamical processes on the titanium and…
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