Multiple Instance Learning with the Optimal Sub-Pattern Assignment Metric
Quang N. Tran, Ba-Ngu Vo, Dinh Phung, Ba-Tuong Vo, and Thuong Nguyen

TL;DR
This paper introduces the Optimal Sub-Pattern Assignment metric for multiple instance learning, enabling flexible solutions across clustering, classification, and novelty detection tasks with demonstrated effectiveness on various datasets.
Contribution
The paper presents a novel metric tailored for multiple instance learning, enhancing versatility in handling different learning tasks.
Findings
Effective in clustering, classification, and novelty detection
Demonstrated versatility on simulated and real datasets
Improves upon existing set distance measures
Abstract
Multiple instance data are sets or multi-sets of unordered elements. Using metrics or distances for sets, we propose an approach to several multiple instance learning tasks, such as clustering (unsupervised learning), classification (supervised learning), and novelty detection (semi-supervised learning). In particular, we introduce the Optimal Sub-Pattern Assignment metric to multiple instance learning so as to provide versatile design choices. Numerical experiments on both simulated and real data are presented to illustrate the versatility of the proposed solution.
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Taxonomy
TopicsImage Retrieval and Classification Techniques · Data Management and Algorithms · Rough Sets and Fuzzy Logic
