# Quantum state atomic force microscopy

## TL;DR

This paper introduces a quantum mechanical approach to atomic force microscopy using squeezed states of probe displacement, enabled by nanomechanical interactions in the van der Waals regime, aiming to enhance nanometrology resolution.

## Contribution

It presents a novel quantum modality for atomic force microscopy leveraging squeezed states, expanding the capabilities of nanometrology techniques.

## Key findings

- Squeezing is enabled nanomechanically in the van der Waals regime.
- The quantum modality operates in the non-contact attractive regime.
- Potential for higher resolution in nanometrology applications.

## Abstract

New classical modalities of atomic force microscopy continue to emerge to achieve higher spatial, spectral, and temporal resolution for nanometrology of materials. Here, we introduce the concept of a quantum mechanical modality that capitalizes on squeezed states of probe displacement. We show that such squeezing is enabled nanomechanically when the probe enters the van der Waals regime of interaction with a sample. The effect is studied in the non-contact mode, where we consider the parameter domains characterizing the attractive regime of the probe-sample interaction force.