# Magnetic properties, domain wall creep motion and the Dzyaloshinskii-Moriya interaction in Pt/Co/Ir thin films

## TL;DR

This paper investigates the magnetic properties and domain wall dynamics in Pt/Co/Ir thin films, focusing on measuring the Dzyaloshinskii-Moriya interaction using domain wall creep methods and analyzing the effects of in-plane bias fields.

## Contribution

It introduces a detailed analysis of the domain wall creep method for quantifying the Dzyaloshinskii-Moriya interaction in ultra-thin films, considering the influence of in-plane bias fields and domain wall roughness.

## Key findings

- The DM interaction can be measured via domain expansion in the creep regime.
- Creep parameters vary with in-plane bias field, affecting measurement accuracy.
- Both energy barrier and velocity scaling parameters change with in-plane bias field.

## Abstract

We study the magnetic properties of perpendicularly magnetised Pt/Co/Ir thin films and investigate the domain wall creep method of determining the interfacial Dzyaloshinskii-Moriya (DM) interaction in ultra-thin films. Measurements of the Co layer thickness dependence of saturation magnetisation, perpendicular magnetic anisotropy, and symmetric and antisymmetric (i.e. DM) exchange energies in Pt/Co/Ir thin films have been made to determine the relationship between these properties. We discuss the measurement of the DM interaction by the expansion of a reverse domain in the domain wall creep regime. We show how the creep parameters behave as a function of in-plane bias field and discuss the effects of domain wall roughness on the measurement of the DM interaction by domain expansion. Whereas modifications to the creep law with DM field and in-plane bias fields have taken into account changes in the energy barrier scaling parameter $\alpha$, we find that both $\alpha$ and the velocity scaling parameter $v_{0}$ change as a function of in-plane bias field.