# Directional Sensitivity In Light-Mass Dark Matter Searches With Single-Electron Resolution Ionization Detectors

## TL;DR

This paper proposes a novel method using solid state detectors with single-electron resolution to detect low-mass dark matter particles, specifically WIMPs below 1 GeV, by leveraging directional sensitivity.

## Contribution

It introduces a new approach for low-mass WIMP detection using calibrated semiconductor detectors capable of directional sensitivity, filling a gap in existing techniques.

## Key findings

- Semiconductor detectors can be calibrated for directional sensitivity to low-mass WIMPs.
- Analysis of semiconductor response to low-mass WIMP interactions.
- Potential for detecting galactic-origin WIMPs below 1 GeV.

## Abstract

We propose a method using solid state detectors with directional sensitivity to dark matter interactions to detect low-mass Weakly Interacting Massive Particles (WIMPs) originating from galactic sources. In spite of a large body of literature for high-mass WIMP detectors with directional sensitivity, no available technique exists to cover WIMPs in the mass range <1 GeV. We argue that single-electron resolution semiconductor detectors allow for directional sensitivity once properly calibrated. We examine commonly used semiconductor material response to these low-mass WIMP interactions.