# Manipulating low-dimensional materials down to the level of single atoms with electron irradiation

## TL;DR

This paper explores the use of advanced STEM techniques to manipulate and observe low-dimensional materials at the atomic level, demonstrating precise control over individual atoms like silicon in graphene.

## Contribution

It introduces methods for single-atom manipulation using electron beams and discusses the observed atomic dynamics under electron irradiation.

## Key findings

- Electron beams can move silicon atoms in graphene with atomic precision.
- Sub-atomic focused electron beams enable real-time atomic structure analysis.
- Demonstrated control over atomic-scale manipulation using STEM.

## Abstract

Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual atoms. Here we discuss the dynamics that are observed in the structure of low-dimensional materials under electron irradiation, and the potential use of electron beams for single-atom manipulation. As a demonstration of the latter capability, we show how momentum transfer from the electrons of a 60-keV {\AA}ngstr\"om-sized STEM probe can be used to move silicon atoms embedded in the graphene lattice with atomic precision.