Positive-Unlabeled Learning with Non-Negative Risk Estimator
Ryuichi Kiryo, Gang Niu, Marthinus C. du Plessis, and Masashi Sugiyama

TL;DR
This paper introduces a non-negative risk estimator for positive-unlabeled learning that enhances robustness against overfitting, enabling the effective use of flexible models like deep neural networks with limited positive data.
Contribution
It proposes a novel non-negative risk estimator for PU learning that reduces overfitting and allows the use of highly flexible models, with theoretical analysis and empirical validation.
Findings
Fixes overfitting issues of unbiased PU learning methods
Enables training with deep neural networks on limited positive data
Provides theoretical bounds and analysis of the estimator
Abstract
From only positive (P) and unlabeled (U) data, a binary classifier could be trained with PU learning, in which the state of the art is unbiased PU learning. However, if its model is very flexible, empirical risks on training data will go negative, and we will suffer from serious overfitting. In this paper, we propose a non-negative risk estimator for PU learning: when getting minimized, it is more robust against overfitting, and thus we are able to use very flexible models (such as deep neural networks) given limited P data. Moreover, we analyze the bias, consistency, and mean-squared-error reduction of the proposed risk estimator, and bound the estimation error of the resulting empirical risk minimizer. Experiments demonstrate that our risk estimator fixes the overfitting problem of its unbiased counterparts.
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Taxonomy
TopicsMachine Learning and Data Classification · Machine Learning and Algorithms · Domain Adaptation and Few-Shot Learning
