Stark profiles modeling of radiation lines originating from atomic autoionizing states in dense plasmas, solid state matter under short intense XUV/X-ray free electron laser irradiation

TL;DR

This paper updates the modeling of Stark line profiles for autoionizing states in dense plasmas, considering microfield effects and non-Boltzmann distributions, relevant for X-ray laser interactions with solid matter.

Contribution

It introduces a revised approach to Stark profile calculations that accounts for microfield effects and autoionizing state distributions in dense plasmas.

Findings

Enhanced accuracy in Stark profile modeling for autoionizing states.

Implications for interpreting radiation from XFEL-irradiated dense matter.

Highlights limitations of standard statistical approaches in dense plasma conditions.

Abstract

In the present paper we propose to update the standard calculation of Stark line profiles for autoionizing atomic states in dense plasmas, i.e. warm dense matter and strongly coupled plasmas. This is motivated by the importance of taking into account the effect of the electric microfield generated by the plasma charge constituents in the calculation of the atomic populations of autoionizing states which leads to the modification of the calculation of Stark line profiles in the frame of the standard theory. This is due to the properties of the autoionizing atomic states that are far from Boltzmann distribution even in dense plasmas bringing serious doubts on the statistical approach used in the standard theory of Stark profile calculations. We discuss the importance of the present analysis in view of the radiation emission originating from dense plasmas created by the interaction of the X-ray Free Electron Lasers (XFEL's) with solid density matter.