Neutron irradiation test of depleted CMOS pixel detector prototypes
Igor Mandi\'c, Vladimir Cindro, Andrej Gori\v{s}ek, Bojan Hiti, Gregor, Kramberger, Marko Miku\v{z}, Marko Zavrtanik, Tomasz Hemperek, Michael Daas,, Fabian H\"ugging, Hans Kr\"ugerc, David-Leon Pohl, Norbert Wermes, Laura, Gonella

TL;DR
This study investigates the charge collection and depletion layer behavior of depleted CMOS pixel detectors on p-type substrates under neutron irradiation, demonstrating their suitability for HL-LHC tracking applications.
Contribution
It provides the first detailed analysis of neutron irradiation effects on depleted CMOS pixel detectors' charge collection properties and depletion thickness.
Findings
Depletion thickness increases after initial irradiation steps due to acceptor removal.
At higher fluences, depletion thickness decreases because of radiation-induced defects.
Depleted layer thickness exceeds 50 μm at 100 V after high fluence irradiation, suitable for HL-LHC detectors.
Abstract
Charge collection properties of depleted CMOS pixel detector prototypes produced on p-type substrate of 2 kcm initial resistivity (by LFoundry 150 nm process) were studied using Edge-TCT method before and after neutron irradiation. The test structures were produced for investigation of CMOS technology in tracking detectors for experiments at HL-LHC upgrade. Measurements were made with passive detector structures in which current pulses induced on charge collecting electrodes could be directly observed. Thickness of depleted layer was estimated and studied as function of neutron irradiation fluence. An increase of depletion thickness was observed after first two irradiation steps to 110 n/cm and 510 n/cm and attributed to initial acceptor removal. At higher fluences the depletion thickness at given voltage decreases with increasing fluence…
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