# Optimization of thin n-in-p planar pixel modules for the ATLAS upgrade at HL-LHC

## TL;DR

This paper investigates the performance of thin n-in-p planar pixel sensors, including active edge designs, for the ATLAS upgrade at HL-LHC, focusing on efficiency, irradiation effects, and high pseudo-rapidity conditions.

## Contribution

It presents a comprehensive characterization of thin planar pixel sensors with different edge designs and irradiation resilience for the HL-LHC upgrade.

## Key findings

- Active edge sensors show high efficiency at edges.
- Sensor thickness impacts performance after irradiation.
- High incident angle tests simulate forward region conditions.

## Abstract

The ATLAS experiment will undergo around the year 2025 a replacement of the tracker system in view of the high luminosity phase of the LHC (HL-LHC) with a new 5-layer pixel system. Thin planar pixel sensors are promising candidates to instrument the innermost region of the new pixel system, thanks to the reduced contribution to the material budget and their high charge collection efficiency after irradiation. The sensors of 50-150 $\mu$m thickness, interconnected to FE-I4 read-out chips, have been characterized with radioactive sources and beam tests. In particular active edge sensors have been investigated. The performance of two different versions of edge designs are compared: the first with a bias ring, and the second one where only a floating guard ring has been implemented. The hit efficiency at the edge has also been studied after irradiation at a fluence of $10^{15}$ \neqcm. Highly segmented sensors will represent a challenge for the tracking in the forward region of the pixel system at HL-LHC. In order to reproduce the performance of 50x50 $\mu$m$^2$ pixels at high pseudo-rapidity values, FE-I4 compatible planar pixel sensors have been studied before and after irradiation in beam tests at high incidence angles with respect to the short pixel direction. Results on the hit efficiency in this configuration are discussed for different sensor thicknesses.