Rupture index: a quantitative measurement of sub-micrometer cracks in graphene
Hadi Arjmandi-Tash, Lin Jiang, Gr\'egory F. Schneider

TL;DR
This paper introduces the rupture index, a quantitative measure of sub-micrometer cracks in graphene, using fluorescence quenching microscopy to assess transfer methods and oxidation effects.
Contribution
The paper presents a novel rupture index parameter that quantifies crack density in graphene, enabling comparison of transfer techniques and oxidation states.
Findings
Rupture index effectively measures crack density in graphene.
Fluorescence quenching microscopy distinguishes cracks from substrate.
The method compares transfer techniques and oxidation effects.
Abstract
Per weight graphene is stronger than steel, but because graphene is so thin, it breaks and evidently forms cracks during handling, particularly when supporting polymers are not used for transfer. In this paper, the parameter rupture index is introduced to quantify the density of the cracks and related defects in graphene during processing. The approach takes the advantages of the high contrast achievable in fluorescence quenching microscopy to distinguish between graphene and the background substrate, visible through the cracks in graphene. The rupture index can well compare the effectiveness of different graphene transferring methods in minimizing the formation of the cracks, and quantify the oxidation of metals protected with graphene.
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Taxonomy
TopicsIntegrated Circuits and Semiconductor Failure Analysis · Graphene research and applications · Advancements in Photolithography Techniques
