The Use of KF Style Flanges In Low Particulate Applications
K.R. Kendziora, J. Angelo, C. Baffes, D. Franck, R. Kellett (Fermilab)

TL;DR
This paper evaluates KF style flanges for low particulate vacuum systems in particle accelerators, demonstrating they generate comparable or fewer particles than traditional conflat flanges, thus facilitating easier diagnostic instrument attachment.
Contribution
It introduces the use of KF flanges for low particulate applications and provides experimental comparison data showing their effectiveness and particle generation levels.
Findings
KF flanges produce equal or fewer particles than conflat flanges.
KF flanges are suitable for temporary diagnostic connections in particle-sensitive environments.
The study supports adopting KF flanges for low particulate vacuum systems.
Abstract
As SCRF particle accelerator technology advances the need for "low particulate" and "particle free" vacuum systems becomes greater and greater. In the course of the operation of these systems, there comes a time when various instruments have to be temporarily attached for diagnostic purposes: RGAs, leak detectors, and additional pumps. In an effort to make the additions of these instruments easier and more time effective, we propose to use KF style flanges for these types of temporary diagnostic connections. This document will describe the tests used to compare the particles generated using the assembly of the, widely accepted for "particle free" use, conflat flange to the proposed KF style flange, and demonstrate that KF flanges produce comparable or even less particles.
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Taxonomy
TopicsParticle Accelerators and Free-Electron Lasers · Particle accelerators and beam dynamics · Superconducting Materials and Applications
