Single photon superradiant decay of cyclotron resonance in a p-type single-crystal semiconductor film with a cubic structure

TL;DR

This paper investigates single-photon superradiant decay during cyclotron resonance in a perfect p-type semiconductor film, revealing how emission rate scales with film size and depends on fundamental constants.

Contribution

It demonstrates the size-dependent superradiant emission in a cubic p-type semiconductor film under cyclotron resonance, highlighting a fundamental scaling law.

Findings

Superradiant emission rate scales with film area.

Emission power depends on fundamental constants and field ratio.

Optimal film size enhances superradiance probability.

Abstract

We study a single-photon super-radiance under the conditions of cyclotron resonance in a perfect single-crystal p-type semiconductor film with cubic structure. We show that the rate of super-radiant emission scales with tjhe film area. which allows one to specify the size of the film at which the probability of a single-photon super-radiance becomes much greater than the probabilities of other scattering channels. The power of super-radiant emission depends only on three fundamental constants: the electron charge q_{e}, the speed of light c, the electron mass m_{e}, and on the electric- to magnetic field ratio.