Near-field speckle-scanning-based X-ray tomography

TL;DR

This paper improves near-field speckle-scanning X-ray tomography by reducing sample exposures, making it more practical for CT imaging, especially with high divergence beams, without sacrificing sensitivity or resolution.

Contribution

It introduces methods to significantly lower the number of exposures needed for speckle scanning X-ray tomography, enhancing its efficiency and applicability.

Findings

Reduced number of exposures for effective imaging

Maintains high sensitivity and resolution

Compatible with high divergence beams

Abstract

We previously demonstrated near-field speckle scanning based x-ray imaging to be an easy-to-implement phase sensing method capable of providing both high sensitivity and high resolution. Yet, this performance combination could only be achieved at the cost of a significant number of sample exposures and of extensive data acquisition time, thus tempering its implementation for tomography applications. Herein, we show ways of drastically lowering the number of exposures for the speckle scanning method to become attractive for computed tomography (CT) imaging. As the method presented can cope with a high divergence beam, it is also expected to attract the attention of the laboratory sources community.