Polarization dependence of transverse photo-induced voltage in gold thin film with random nanoholes

TL;DR

This study investigates how the polarization of light affects the transverse photo-induced voltage in a gold film with random nanoholes, revealing polarization-dependent patterns and proposing a new ellipticity measurement method.

Contribution

It demonstrates the polarization dependence of TPIV in nanostructured gold films and introduces a novel ellipticity meter based on angular momentum transfer mechanisms.

Findings

TPIV varies with light polarization and pattern depends on ellipticity.

Experimental results align with angular momentum transfer model.

Proposes a new method for measuring light ellipticity.

Abstract

Transverse photo-induced voltage (TPIV) in 25nm-thick Au film with random holes with 100 nm in diameter is measured for linearly, circularly and elliptically polarized light. By rotating the major axis of ellipse of the light, TPIV exhibits specific pattern depending on polarization. The experimental results are readily reproduced by assuming that the angular momentum transfer from the light beam to the film is responsible for TPIV. A novel ellipticity meter is proposed based on this mechanism.