Absorption and scattering by interstellar dust in the silicon K-edge of GX 5-1
S.T. Zeegers (1), E. Costantini (1), C.P. de Vries (1), A.G.G.M., Tielens (2), H. Chihara (3), F. de Groot (4), H. Mutschke (5), L.B.F.M., Waters (1, 6), S. Zeidler (7) ((1) SRON, (2) Leiden Observatory, (3) Osaka, University, (4) Debye Institute for Nanomaterials Science

TL;DR
This study uses laboratory measurements and X-ray observations to analyze interstellar dust properties, focusing on silicon absorption features in the spectrum of GX 5-1, revealing dust composition and size distribution.
Contribution
It introduces new laboratory-derived absorption profiles for silicate dust and applies them to astrophysical data, improving understanding of dust composition along the Galactic Plane.
Findings
Silicon abundance in dust is approximately 4.0×10^{-5} per H atom.
Best fit dust model includes olivine and pyroxene silicates.
Evidence suggests the presence of large dust particles along the line of sight.
Abstract
We study the absorption and scattering of X-ray radiation by interstellar dust particles, which allows us to access the physical and chemical properties of dust. The interstellar dust composition is not well understood, especially on the densest sight lines of the Galactic Plane. X-rays provide a powerful tool in this study. We present newly acquired laboratory measurements of silicate compounds taken at the Soleil synchrotron facility in Paris using the Lucia beamline. The dust absorption profiles resulting from this campaign were used in this pilot study to model the absorption by interstellar dust along the line of sight of the low-mass X-ray binary (LMXB) GX 5-1. The measured laboratory cross-sections were adapted for astrophysical data analysis and the resulting extinction profiles of the Si K-edge were implemented in the SPEX spectral fitting program. We derive the properties of…
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