Rigorous Diffraction Interface Theory

TL;DR

This paper introduces Rigorous Diffraction Interface Theory (R-DIT), an analytical framework that accurately models the optical properties of metasurfaces, bridging the gap between thin and thick structures without complex propagation calculations.

Contribution

The paper presents a novel formalism, R-DIT, that directly relates metasurface composition and geometry to optical responses, simplifying analysis of diffractive optical devices.

Findings

Provides an analytical method for metasurface optical properties

Eliminates the need for propagation calculations in thin layers

Links structure directly to transmission, reflection, and diffraction

Abstract

We present a new formalism for understanding the optical properties of metasurfaces, optically thin composite diffractive devices. The proposed technique, Rigorous Diffraction Interface Theory (R-DIT), provides an analytical framework for understanding the transition between optically thin and optically thick structures. For metasurfaces, R-DIT avoids the calculation of optical propagation through thin layer and provides a direct link between the composition and geometry of a metasurface and its transmission, reflection, and diffraction properties.