X-ray Metrology of an Array of Active Edge Pixel Sensors for Use at Synchrotron Light Sources

TL;DR

This paper demonstrates the successful production and testing of an array of active edge silicon sensors with high efficiency, suitable for large-scale use at synchrotron light sources, verified through x-ray and optical measurements.

Contribution

It presents the development and testing of a prototype large array of active edge silicon sensors for synchrotron applications, showing their viability and efficiency.

Findings

Sensors are sensitive to the physical edge with minimal efficiency loss.

Efficiency maps confirm high performance of the sensor array.

Sensor technology is suitable for large-scale deployment at light sources.

Abstract

We report on the production of an array of active edge silicon sensors as a prototype of a large array. Four Medipix3RX.1 chips were bump bonded to four single chip sized Advacam active edge n-on-n sensors. These detectors were then mounted into a 2 by 2 array and tested on B16 at Diamond Light Source with an x-ray beam spot of 2um. The results from these tests, compared with optical metrology give confidence that these sensors are sensitive to the physical edge of the sensor, with only a modest loss of efficiency in the final two rows of pixels. We present the efficiency maps recorded with the microfocus beam and a sample powder diffraction measurement. These results give confidence that this sensor technology can be used in much larger arrays of detectors at synchrotron light sources.