Resonant Raman imaging of MoS2-substrate interaction
Hongyuan Li, Dmitri V. Voronine
TL;DR
This paper introduces a resonant Raman imaging technique to study MoS2-substrate interactions, revealing a new method for thickness determination and analyzing substrate effects on Raman spectra.
Contribution
It presents a novel resonant Raman imaging approach to analyze MoS2 interactions with substrates, including a new thickness measurement method and interference-based intensity analysis.
Findings
Thickness-dependent peak shift of Raman-forbidden mode
Interference enhancement explains Raman intensity dependence
Resonant Raman spectra vary with substrate type
Abstract
We report a study of long-range MoS2-substrate interaction using resonant Raman imaging. We observed a strong thickness-dependent peak shift of a Raman-forbidden mode that can be used as a new method of determining the thickness of multilayered MoS2 flakes. In addition, dependence of the Raman scattering intensity on thickness is explained by the interference enhancement theory. Finally, the resonant Raman spectra on different substrates are analysed.
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Taxonomy
TopicsSpectroscopy Techniques in Biomedical and Chemical Research · Ichthyology and Marine Biology · Advanced Fiber Optic Sensors