Temporal correlations and structural memory effects in break junction measurements
A. Magyarkuti, K.P. Lauritzen, Z. Balogh, A. Ny\'ary, G. M\'esz\'aros,, P. Makk, G.C. Solomon, A. Halbritter

TL;DR
This paper reviews data analysis techniques for studying temporal correlations in break junction measurements, revealing structural memory effects and the influence of temperature and contact conditions on conductance trace independence.
Contribution
It introduces shifted correlation plots and demonstrates their effectiveness in analyzing temporal correlations and structural memory effects in atomic and molecular junctions.
Findings
Surface diffusion helps produce independent conductance traces at room temperature.
Repetition tendencies in conductance traces are temperature-dependent.
Contact memory effects are observed in Pt-CO-Pt single-molecule junctions.
Abstract
We review data analysis techniques that can be used to study temporal correlations among conductance traces in break junction measurements. We show that temporal histograms are a simple but efficient tool to check the temporal homogeneity of the conductance traces, or to follow spontaneous or triggered temporal variations, like structural modifications in trained contacts, or the emergence of single-molecule signatures after molecule dosing. To statistically analyze the presence and the decay time of temporal correlations, we introduce shifted correlation plots. Finally, we demonstrate that correlations between opening and subsequent closing traces may indicate structural memory effects in atomic-sized metallic and molecular junctions. Applying these methods on measured and simulated gold metallic contacts as a test system, we show that the surface diffusion induced flattening of the…
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