Cross sections of X-ray production induced by C and Si ions with energies up to 1 MeV/u on Ti, Fe, Zn, Nb, Ru and Ta

TL;DR

This study measures X-ray production cross sections induced by C and Si ions on various metals, comparing results with theoretical models, and finds general agreement with some discrepancies for specific elements.

Contribution

It provides new experimental cross section data for C and Si ions on multiple targets and evaluates the accuracy of the ECPSSR theoretical model with corrections.

Findings

Measured cross sections generally agree with previous data.

ECPSSR with united atoms correction closely matches experimental values for certain elements.

Discrepancies observed for Ti, Fe, and Zn with Si ions.

Abstract

X-ray production differential cross sections induced by C and Si ions with energies from 1 MeV/u down to 0.25 MeV/u, produced by the CMAM 5 MV tandem accelerator, have been measured for thin targets of Ti, Fe, Zn, Nb, Ru and Ta in a direct way. X-rays have been detected by a fully characterized silicon drift diode and beam currents have been measured by a system of two Faraday cups. Measured cross sections agree in general with previously published results. The ECPSSR theory with the united atoms correction gives absolute values close to the experimental ones for all the studied elements excited by C ions and for Ta, Nb and Ru excited by Si ions. For Ti, Fe and Zn excited by Si, the basic ECPSSR theory gives better agreement, although on absolute values the gap for Ti is still large.