A new method to reduce the statistical and systematic uncertainty of chance coincidence backgrounds measured with waveform digitizers

TL;DR

This paper introduces a novel method utilizing waveform digitizers to significantly reduce statistical and systematic uncertainties in measuring chance coincidence backgrounds, enabling more accurate and efficient coincidence data collection.

Contribution

The paper presents a new technique leveraging near-zero dead time waveform digitizers to improve background measurement accuracy in coincidence experiments.

Findings

Achieves up to fourfold improvement in background measurement precision.

Demonstrates the method with preliminary data on prompt fission neutron spectra.

Reduces statistical fluctuations in background measurements.

Abstract

A new method for measuring chance-coincidence backgrounds during the collection of coincidence data is presented. The method relies on acquiring data with near-zero dead time, which is now realistic due to the increasing deployment of flash electronic-digitizer (waveform digitizer) techniques. An experiment designed to use this new method is capable of acquiring more coincidence data, and a much reduced statistical fluctuation of the measured background. A statistical analysis is presented, and used to derive a figure of merit for the new method. Factors of four improvement over other analyses are realistic. The technique is illustrated with preliminary data taken as part of a program to make new measurements of the prompt fission neutron spectra at Los Alamos Neutron Science Center. It is expected that the these measurements will occur in a regime where the maximum figure of merit will be exploited.