The Fluctuating Two-Ray Fading Model: Statistical Characterization and Performance Analysis
Juan M. Romero-Jerez, F. Javier Lopez-Martinez, Jos\'e F. Paris and, Andrea J. Goldsmith

TL;DR
The paper introduces the Fluctuating Two-Ray (FTR) fading model, a new statistical channel model that generalizes TWDP by including amplitude fluctuations, with closed-form expressions and validation against millimeter-wave measurements.
Contribution
It presents the FTR fading model with closed-form probability functions, approximate expressions, and demonstrates its superior fit to millimeter-wave data over Rician models.
Findings
FTR model fits 28 GHz outdoor measurements better than Rician.
Closed-form and approximate expressions for FTR statistics are derived.
Performance analysis shows FTR parameters significantly impact system reliability.
Abstract
We introduce the Fluctuating Two-Ray (FTR) fading model, a new statistical channel model that consists of two fluctuating specular components with random phases plus a diffuse component. The FTR model arises as the natural generalization of the two-wave with diffuse power (TWDP) fading model; this generalization allows its two specular components to exhibit a random amplitude fluctuation. Unlike the TWDP model, all the chief probability functions of the FTR fading model (PDF, CDF and MGF) are expressed in closed-form, having a functional form similar to other state-of-the-art fading models. We also provide approximate closed-form expressions for the PDF and CDF in terms of a finite number of elementary functions, which allow for a simple evaluation of these statistics to an arbitrary level of precision. We show that the FTR fading model provides a much better fit than Rician fading for…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
