Design and Test of Wire-Scanners for SwissFEL
G. L. Orlandi, M. Baldinger, H. Brands, P. Heimgartner, R. Ischebeck,, A. Kammerer, F. L\"ohl, R. L\"uscher, P. Mohanmurthy, C. Ozkan, V. Schlott,, L. Schulz, B. Rippstein, C. Seiler, S. Trovati, P. Valitutti, D. Zimoch
TL;DR
This paper presents the design, laboratory testing, and beam testing of wire-scanners for SwissFEL, which are used to monitor the electron beam profile with minimal beam disturbance.
Contribution
It introduces a new wire-scanner prototype for SwissFEL, detailing its design, laboratory characterization, and beam-test results.
Findings
Wire-scanners provide quasi-non-destructive beam profile monitoring.
Laboratory tests confirmed the scanner's performance.
Beam tests demonstrated effective profile measurement in SwissFEL conditions.
Abstract
The SwissFEL light-facility will provide coherent X-rays in the wavelength region 7-0.7 nm and 0.7-0.1 nm. In SwissFEL, view-screens and wire-scanners will be used to monitor the transverse profile of a 200/10pC electron beam with a normalized emittance of 0.4/0.2 mm.mrad and a final energy of 5.8 GeV. Compared to view screens, wire-scanners offer a quasi-non-destructive monitoring of the beam transverse profile without suffering from possible micro-bunching of the electron beam. The main aspects of the design, laboratory characterization and beam-test of the SwissFEL wire-scanner prototype will be discussed.
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Particle Accelerators and Free-Electron Lasers · Electron and X-Ray Spectroscopy Techniques