Characterization methods dedicated to nanometer-thick hBN layers

TL;DR

This paper reviews optical spectroscopic and structural characterization techniques for nanometer-thick hBN layers, emphasizing their effectiveness in assessing quality and properties for use in advanced 2D material applications.

Contribution

It introduces specific optical and structural characterization procedures tailored for nanometer-thick hBN layers, demonstrating their utility in quality assessment.

Findings

Optical spectroscopies effectively characterize hBN layers.

Cathodoluminescence and Raman reveal structural and optical properties.

Transmission electron microscopy supports structural analysis.

Abstract

Hexagonal boron nitride (hBN) regains interest as a strategic component in graphene engineering and in van der Waals heterostructures built with two dimensional materials. It is crucial then, to handle reliable characterization techniques capable to assess the quality of structural and electronic properties of the hBN material used. We present here characterization procedures based on optical spectroscopies, namely cathodoluminescence and Raman, with the additional support of structural analysis conducted by transmission electron microscopy. We show the capability of optical spectroscopies to investigate and benchmark the optical and structural properties of various hBN thin layers sources.