Modified Bohm's theory for abstruse measurements: application to layer depth profiling by Auger spectroscopy

TL;DR

This paper applies a modified Bohm formalism to interpret complex layer depth profiles obtained from Auger spectroscopy, enabling the conversion of abstruse measurements into real physical layer structures.

Contribution

The study introduces a modified Bohm theory incorporating Auger electron effects to analyze and interpret complex layer profiles in surface analysis.

Findings

Abstruse layer profiles can be transformed into real structures using the modified Bohm approach.

Stationary probability density predicts multilayer structures from complex depth profiles.

A criterion for distinguishing physical from unphysical multilayer systems was established.

Abstract

Modified Bohm formalism is applied to solve a problem of abstruse layer depth profiles measured by the Auger electron spectroscopy technique in real physical systems, i.e., the desorbed carbon/passive layer on NiTi substrate and the adsorbed oxygen/surface of NiTi alloy. It is shown that abstruse layer profiles may be converted to real layer structures using the modified Bohm theory, where the quantum potential is due to an Auger electron effect. It is also pointed out that the stationary probability density predicts multilayer structures of abstruse depth profiles caused by carbon desorption and oxygen adsorption processes. The criterion for a kind of break between the physical and unphysical multilayer systems was found. We have concluded that the physics is also characterized by the abstruse measurement and the modified Bohm formalism