Fast probe of local electronic states in nanostructures utilizing a single-lead quantum dot

TL;DR

This paper introduces a rapid, single-lead quantum dot micro-probe that uses RF reflectometry to directly and robustly access local electronic states in nanostructures across a wide bandwidth.

Contribution

It presents a novel micro-probe design utilizing a quantum dot coupled to target structures, enabling fast, wide-bandwidth measurements of local electronic states.

Findings

Probe can access local electronic states with wide bandwidth

Operations are robust against bias voltages and temperatures

Accesses more electronic states beyond the Fermi level

Abstract

Transport measurements are powerful tools to probe electronic properties of solid-state materials. To access properties of local electronic states in nanostructures, such as local density of states, electronic distribution and so on, micro-probes utilizing artificial nanostructures have been invented to perform measurements in addition to those with conventional macroscopic electronic reservoirs. Here we demonstrate a new kind of micro-probe: a fast single-lead quantum dot probe, which utilizes a quantum dot coupled only to the target structure through a tunneling barrier and fast charge readout by RF reflectometry. The probe can directly access the local electronic states with wide bandwidth. The probe can also access more electronic states, not just those around the Fermi level, and the operations are robust against bias voltages and temperatures.