Diminish Electrostatic in Piezoresponse Force Microscopy through longer ultra-stiff tips

TL;DR

This paper introduces longer, ultra-stiff probes in Piezoresponse Force Microscopy to reduce electrostatic artifacts, enhancing measurement accuracy for various materials by combining theoretical modeling and experimental validation.

Contribution

It develops a theoretical model for electrostatic effects in PFM and demonstrates that longer, ultra-stiff tips effectively diminish electrostatic interactions, improving measurement fidelity.

Findings

Longer, ultra-stiff tips reduce electrostatic contributions in PFM.

Theoretical model accurately predicts electrostatic effects across different probes.

Experimental validation confirms the effectiveness of the proposed tip design.

Abstract

Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the mechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to piezoelectricity, other physical phenomena, especially electrostatic interaction, can contribute to the signal read. We address this problematic through the use of longer ultra-stiff probes providing state of the art sensitivity, with the lowest electrostatic interaction and avoiding working in high frequency regime. In order to find this solution we develop a theoretical description addressing the effects of electrostatic contributions in the total cantilever vibration and its quantification for different setups. The theory is subsequently tested in a Periodically Poled Lithium Niobate (PPLN) crystal, a sample with well-defined 0deg and 180deg domains, using different commercial available conductive tips. We employ the theoretical description to compare the electrostatic contribution effects into the total phase recorded. Through experimental data our description is corroborated for each of the tested commercially available probes. We propose that a larger probe length can be a solution to avoid electrostatic forces, so the cantilever-sample electrostatic interaction is reduced. For hard oxide samples we propose an ultra-stiff cantilever which avoids the use of high frequency voltage but still diminishing electrostatic forces. Our proposed commercially available solution have great implications into avoiding artifacts while studying soft biological samples, multiferroic oxides, and thin film ferroelectric materials and it opens a new window into tip engineering.