Visualization of defect-induced excitonic properties of the edges and grain boundaries in synthesized monolayer molybdenum disulfide
A. E. Yore, K.K.H. Smithe, W. Crumrine, A. Miller, J. A. Tuck, B., Redd, E. Pop, Bin Wang, A.K.M. Newaz

TL;DR
This study uses high-resolution photoluminescence microscopy to reveal nanoscale excitonic phenomena at the edges and grain boundaries of CVD-grown monolayer MoS₂, highlighting defect-induced optical property modifications.
Contribution
It demonstrates the first sub-micron spatial resolution PL imaging of large monolayer MoS₂, revealing defect-related excitonic features and their theoretical explanation via oxygen dimer adsorption.
Findings
Edges fluoresce 1000% brighter than interior regions.
Parallel fluorescing lines observed at edges.
Giant blue shift (~120 meV) in excitonic peaks at edges.
Abstract
Atomically thin two-dimensional (2D) transition metal dichalcogenides (TMDCs) are attractive materials for next generation nanoscale optoelectronic applications. Understanding nanoscale optical behavior of the edges and grain boundaries of synthetically grown TMDCs is vital for optimizing their optoelectronic properties. Elucidating the nanoscale optical properties of 2D materials through far-field optical microscopy requires a diffraction-limited optical beam diameter sub-micron in size. Here we present our experimental work on spatial photoluminescence (PL) scanning of large size ( microns) monolayer MoS grown by chemical vapor deposition (CVD) using a diffraction limited blue laser beam spot (wavelength 405 nm) with a beam diameter as small as 200 nm allowing us to probe nanoscale excitonic phenomena which was not observed before. We have found several important…
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