Imaging non-local electron transport via local excess noise

TL;DR

This paper introduces a novel scanning noise microscope (SNoiM) that locally detects and maps excess noise at nano-scale resolution in quantum well devices, revealing non-local electron transport phenomena.

Contribution

The study demonstrates the first local detection and mapping of excess noise at THz frequencies using a noninvasive probe, enabling visualization of electron kinetics at nano-scale.

Findings

Achieved ~50nm spatial resolution in noise mapping.

Visualized non-local electron heating and hot-electron transfer.

Demonstrated applicability to various materials beyond conductors.

Abstract

Noise is usually a hindrance to signal detection. As stressed by Landauer, however, noise can be an invaluable signal that reveals kinetics of charge particles. Understanding local non-equilibrium electron kinetics at nano-scale is of decisive importance for the development of miniaturized electronic devices, optical nano-devices, and heat management devices. In non-equilibrium conditions electrons cause current fluctuation (excess noise) that contains fingerprint-like information about the electron kinetics. A crucial challenge is hence a local detection of excess noise and its real-space mapping. However, the challenge has not been tackled in existing noise measurements because the noise studied was the spatially integrated one. Here we report the experiment in which the excess noise at ultra-high-frequency(21.3THz), generated on GaAs/AlGaAs quantum well (QW) devices with a nano-scale constriction, is locally detected and mapped for the first time. We use a sharp tungsten tip as a movable, contact-free and noninvasive probe of the local noise, and achieved nano-scale spatial resolution (~50nm). Local profile of electron heating and hot-electron kinetics at nano-scales are thereby visualized for the first time, disclosing remarkable non-local nature of the transport, stemming from the velocity overshoot and the intervalley hot electron transfer. While we demonstrate the usefulness of our experimental method by applying to mesoscopic conductors, we emphasize that the method is applicable to a variety of different materials beyond the conductor, and term our instrument a scanning noise microscope (SNoiM):In general non-equilibrium current fluctuations are generated in any materials including dielectrics, metals and molecular systems. The fluctuations, in turn, excite fluctuating electric and magnetic evanescent fields on the material surface, which can be detected and imaged by our SNoiM.