Beam distribution reconstruction simulation for electron beam probe
Yongchun Feng, Ruishi Mao, Peng Li, Xincai Kang, Yan Yin, Tong Liu,, Yaoyao You, Yucong Chen, Tiecheng Zhao, Zhiguo Xu, Yanyu Wang, Youjin Yuan

TL;DR
This paper presents a simulation-based study of an electron beam probe technique for non-invasively reconstructing the transverse and longitudinal beam distributions in high-intensity accelerators, demonstrating its effectiveness across various beam profiles.
Contribution
It introduces a theoretical framework and simulation methods for beam distribution reconstruction using electron beam probes, including fast and slow scan techniques, applicable to dense beams.
Findings
Successful profile reconstruction for multiple beam distributions
Effective simultaneous measurement of transverse and longitudinal profiles
Validation of the method with simulations for CADS and HIAF
Abstract
Electron beam probe (EBP) is a new principle detector, which makes use of a low-intensity and low-energy electron beam to measure the transverse profile, bunch shape, beam neutralization and beam wake field of an intense beam with small dimensions. While can be applied to many aspects, we limit our analysis to beam distribution reconstruction. This kind of detector is almost non-interceptive for all of the beam and does not disturb the machine environment. In this paper, we present the theoretical aspects behind this technique for beam distribution measurement and some simulation results of the detector involved. First, a method to obtain parallel electron beam is introduced and a simulation code is developed. And then, EBP as a profile monitor for dense beam is simulated using fast scan method under various target beam profile, such as KV distribution, waterbag distribution, parabolic…
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