Severe signal loss in diamond beam loss monitors in high particle rate environments by charge trapping in radiation-induced defects
Florian Kassel, Moritz Guthoff, Anne Dabrowski, Wim de Boer

TL;DR
This study investigates severe charge trapping and signal loss in diamond beam loss monitors at high particle rates in the LHC, revealing non-linear effects caused by radiation-induced defects and space charge buildup.
Contribution
It introduces a radiation damage model that accurately predicts charge collection efficiency loss in diamond sensors under high-rate conditions.
Findings
Charge trapping causes significant CCE reduction at high rates.
Space charge effects lead to non-linear electric field deformation.
The model predicts CCE loss consistent with LHC environment conditions.
Abstract
The beam condition monitoring leakage (BCML) system is a beam monitoring device in the compact muon solenoid (CMS) experiment at the large hadron collider (LHC). As detectors 32 poly-crystalline (pCVD) diamond sensors are positioned in rings around the beam pipe. Here, high particle rates occur from the colliding beams scattering particles outside the beam pipe. These particles cause defects, which act as traps for the ionization, thus reducing the charge collection efficiency (CCE). However, the loss in CCE was much more severe than expected from low rate laboratory measurements and simulations, especially in single-crystalline (sCVD) diamonds, which have a low initial concentration of defects. The reason why in real experiments the CCE is much worse than in laboratory experiments is related to the ionization rate. At high particle rates the trapping rate of the ionization is so high…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
