Graphical analysis of Current-Voltage Characteristics in Typical Memristive Interfaces

TL;DR

This paper introduces a graphical method for analyzing current-voltage data in memristive interfaces, enabling extraction of microscopic parameters that influence device electrical properties, demonstrated through simulated examples.

Contribution

It presents a novel graphical analysis technique for IV data in memristive interfaces to extract microscopic parameters, enhancing understanding of device behavior.

Findings

The method effectively extracts microscopic parameters from IV data.

Simulations demonstrate the influence of fitting parameters on device characteristics.

The approach provides insights into the electrical properties of metal-oxide interfaces.

Abstract

A graphical representation based on the isothermal current-voltage (IV) measurements of typical memristive interfaces is presented. This is the starting point to extract relevant microscopic information of the parameters that control the electrical properties of a device based on a particular metal-oxide interface. The convenience of the method is illustrated presenting some examples were the IV characteristics were simulated in order to gain insight on the influence of the fitting parameters.