Deflecting cavity dynamics for time-resolved machine studies of SXFEL user facility

TL;DR

This paper discusses the use of a radio frequency deflecting cavity at SXFEL to achieve 10 femtosecond time resolution for electron beam and radiation profile measurements, aiding in machine commissioning and studies.

Contribution

It presents the beam dynamics analysis of the deflecting cavity specifically designed for SXFEL, highlighting its potential for high-resolution, time-resolved measurements.

Findings

Achieves around 10 fs time resolution.

Provides detailed beam dynamics analysis.

Enhances time-resolved diagnostics for SXFEL.

Abstract

Radio frequency deflectors are widely used for time-resolved electron beam energy, emittance and radiation profile measurements in modern free electron laser facilities. In this paper, we present the beam dynamics aspects of the deflecting cavity of SXFEL user facility, which is located at the exit of the undulator. With a targeted time resolution around 10 fs, it is expected to be an important tool for time-resolved commissioning and machine studies for SXFEL user facility.