Probabilistic multi-catalogue positional cross-match
F.-X. Pineau, S. Derriere, C. Motch, F. J. Carrera, F. Genova, L., Michel, B. Mingo, A. Mints, A. Nebot G\'omez-Mor\'an, S. R. Rosen, A. Ruiz, Camu\~nas

TL;DR
This paper introduces a statistical framework for probabilistic cross-matching of multiple astronomical catalogs, focusing on astrometric data and using chi-square tests to estimate association probabilities, validated with synthetic data.
Contribution
It develops a novel chi-match method for multi-catalogue cross-identification based on explicit probabilistic models and geometric considerations, enhancing accuracy and reliability.
Findings
The chi-match method is order-independent for cross-matching.
The framework accurately estimates spurious association rates.
Validated with synthetic catalogues demonstrating effectiveness.
Abstract
We lay the foundations of a statistical framework for multi-catalogue cross-correlation and cross-identification based on explicit simplified catalogue models. A proper identification process should rely on both astrometric and photometric data. Under some conditions, the astrometric part and the photometric part can be processed separately and merged a posteriori to provide a single global probability of identification. The present paper addresses almost exclusively the astrometrical part and specifies the proper probabilities to be merged with photometric likelihoods. To select matching candidates in n catalogues, we used the Chi (or, indifferently, the Chi-square) test with 2(n-1) degrees of freedom. We thus call this cross-match a chi-match. In order to use Bayes' formula, we considered exhaustive sets of hypotheses based on combinatorial analysis. The volume of the Chi-test…
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