Bragg projection ptychography on niobium phase domain

TL;DR

This paper introduces a novel Bragg projection ptychography technique that combines phase-contrast and translational diversity to image domain structures in metallic thin films, demonstrated on niobium on sapphire.

Contribution

It presents a new imaging method that enhances sensitivity to domain structures using Bragg diffraction combined with ptychography.

Findings

Successfully imaged niobium thin film domain structures.

Enhanced contrast in phase-contrast measurements.

Effective analysis with combined refinement mechanisms.

Abstract

We demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg "dark field" imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analysed with the help of a careful combination of implemented refinement mechanisms.