Gate-Tuned Thermoelectric Power in Black Phosphorus
Yu Saito, Takahiko Iizuka, Takashi Koretsune, Ryotaro Arita Sunao, Shimizu, Yoshihiro Iwasa

TL;DR
This study demonstrates how electric-double-layer transistors can effectively tune the thermoelectric power in black phosphorus, revealing significant enhancement and potential for nanoscale thermoelectric applications.
Contribution
It introduces a method to control thermoelectric properties in black phosphorus using gate voltage in an EDLT configuration, with experimental and theoretical insights.
Findings
Thermoelectric power reached +510 μV/K at 210 K in hole-depleted state.
Enhanced thermoelectric power compared to bulk values.
Effective channel thinning explains the power enhancement.
Abstract
The electric field effect is a useful means of elucidating intrinsic material properties as well as for designing functional devices. The electric-double-layer transistor (EDLT) enables the control of carrier density in a wide range, which is recently proved to be an effective tool for the investigation of thermoelectric properties. Here, we report the gate-tuning of thermoelectric power in a black phosphorus (BP) single crystal flake with the thickness of 40 nm. Using an EDLT configuration, we successfully control the thermoelectric power (S), and find that the S of ion-gated BP reached +510 V/K at 210 K in the hole depleted state, which is much higher than the reported bulk single crystal value of +340 V/K at 300 K. We compared this experimental data with the first-principles-based calculation and found that this enhancement is qualitatively explained by the effective…
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