Error-Resilient Machine Learning in Near Threshold Voltage via Classifier Ensemble
Sai Zhang, Naresh Shanbhag

TL;DR
This paper introduces an error-resilient machine learning approach using classifier ensembles, demonstrating superior robustness over centralized models like SVM in near-threshold voltage conditions through architectural error modeling and a novel voting technique.
Contribution
It proposes a classifier ensemble framework for error resilience in NTV environments and introduces an error weighted voting method to further improve robustness.
Findings
RF-based architectures are more robust than SVM in NTV conditions.
RF maintains high detection accuracy with minimal variation under timing errors.
Error weighted voting significantly reduces detection accuracy variation.
Abstract
In this paper, we present the design of error-resilient machine learning architectures by employing a distributed machine learning framework referred to as classifier ensemble (CE). CE combines several simple classifiers to obtain a strong one. In contrast, centralized machine learning employs a single complex block. We compare the random forest (RF) and the support vector machine (SVM), which are representative techniques from the CE and centralized frameworks, respectively. Employing the dataset from UCI machine learning repository and architectural-level error models in a commercial 45 nm CMOS process, it is demonstrated that RF-based architectures are significantly more robust than SVM architectures in presence of timing errors due to process variations in near-threshold voltage (NTV) regions (0.3 V - 0.7 V). In particular, the RF architecture exhibits a detection accuracy (P_{det})…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvancements in Semiconductor Devices and Circuit Design · Low-power high-performance VLSI design · Semiconductor materials and devices
MethodsSupport Vector Machine
