Custom Chipset and Compact Module Design for a 75-110 GHz Laboratory Signal Source
Matthew A. Morgan, Tod A. Boyd, and Jason J. Castro

TL;DR
This paper presents a compact, full-waveguide bandwidth signal source for mm-wave testing, featuring custom MMIC chips, frequency multiplication, and in-situ power monitoring, suitable for size-constrained laboratory environments.
Contribution
Introduction of a novel, compact MMIC-based signal source with integrated functions for efficient mm-wave component testing.
Findings
Achieved full-waveguide bandwidth operation (75-110 GHz).
Demonstrated effective frequency multiplication and power monitoring.
Designed for ease-of-use in constrained test environments.
Abstract
We report on the development and characterization of a compact, full-waveguide bandwidth (WR-10) signal source for general-purpose testing of mm-wave components. The MMIC-based multichip module is designed for compactness and ease-of-use, especially in size-constrained test sets such as a wafer probe station. It takes as input a cm-wave CW reference and provides a factor of three frequency multiplication as well as amplification, output power adjustment, and in-situ output power monitoring. It utilizes a number of custom MMIC chips such as a Schottky-diode limiter and a broadband mm-wave detector, both designed explicitly for this module, as well as custom millimeter-wave multipliers and amplifiers reported in previous papers.
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